Device under test (DUT) refers to the specific physical product being measured, stressed, or validated on a test bench or automated test equipment. Engineers use this term to distinguish the item being evaluated from the instruments, cables, and fixtures performing the test. In semiconductor manufacturing, the DUT is often a single bare die or packaged chip placed into a test socket.
Hook the logic analyzer up to the DUT and let's see if the I2C bus is actually sending an ack.
When setting up a complex measurement, always verify the test fixture's impedance before connecting the DUT, or you might measure the setup's flaws instead of the device's performance.
Related terms
Burn-in
A rigorous testing phase where components operate under stress to force early failures before shipping.
Smoke test
The initial application of power to a newly assembled circuit to check for catastrophic failures.
Socket
A mechanical and electrical receptacle designed to hold and connect a removable component.