Bin
Bin turns up in 2 fields: tides, statistics. Here is what it means to the people in each one.
Bin in tides
One depth cell of an ADCP profile, the slice of water over which a single velocity is averaged.
A fixed-thickness layer of the water column, often 0.25 to 2 m, for which an ADCP reports one velocity. The first bin starts beyond a blanking distance close to the transducer where ringing spoils the data, and bins near the surface or bottom can be contaminated by sidelobe reflections over roughly the last 6 percent of range for 20 degree beams. Choosing bin size trades vertical detail against noise.
"Top two bins are junk from sidelobe off the surface, use bin 14 down for the near-surface current."
Bin in statistics
Test category that each die or unit is sorted into at probe or final test, with bin 1 usually meaning good.
At wafer probe and final test, every die or packaged part is assigned a bin by the first test it fails, or by the grade it passes at. Bin 1 is typically fully good; other bins record failure types such as opens, shorts, leakage or speed, and some hold good parts sorted by performance grade. Bin paretos and bin wafer maps are the first data a yield engineer pulls when sort yield drops.
"Bin 12 leakage fails tripled on the last five lots, mostly center die. Pull the gate oxide thickness data."